Recente aanbestedingen waarbij de leverancier Fei Company wordt genoemd
2017-09-21EA Electron microscopes (S/TEM and FIB-SEM) (Rijksuniversiteit Groningen)
The tender is sub-divided into 2 lots:
— lot 1: Electron Microscope for sub-Ångstrom materials analysis (S/TEM)
— lot 2: Electron and Ion Microscope for sample preparation (FIB-SEM)
Tenderers are entitled to submit tenders for more than 1 lot.
Tenderers can submit per lot 1 to a maximum of 2 offers. In addition, tenderers are allowed to submit a combination offer for both lots. If Tenderer wants to submit a combination offer he needs to submit the offer separately in each lot. (lot 1 — combination and …
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