Leverancier: Fei Company

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2017-09-21   EA Electron microscopes (S/TEM and FIB-SEM) (Rijksuniversiteit Groningen)
The tender is sub-divided into 2 lots: โ€” lot 1: Electron Microscope for sub-ร…ngstrom materials analysis (S/TEM) โ€” lot 2: Electron and Ion Microscope for sample preparation (FIB-SEM) Tenderers are entitled to submit tenders for more than 1 lot. Tenderers can submit per lot 1 to a maximum of 2 offers. In addition, tenderers are allowed to submit a combination offer for both lots. If Tenderer wants to submit a combination offer he needs to submit the offer separately in each lot. (lot 1 โ€” combination and โ€ฆ Bekijk de aanbesteding ยป
Genoemde leveranciers: Fei Company