EA Electron microscopes (S/TEM and FIB-SEM)
The tender is sub-divided into 2 lots:
— lot 1: Electron Microscope for sub-Ångstrom materials analysis (S/TEM)
— lot 2: Electron and Ion Microscope for sample preparation (FIB-SEM)
Tenderers are entitled to submit tenders for more than 1 lot.
Tenderers can submit per lot 1 to a maximum of 2 offers. In addition, tenderers are allowed to submit a combination offer for both lots. If Tenderer wants to submit a combination offer he needs to submit the offer separately in each lot. (lot 1 — combination and lot 2 — combination offer).
Deadline
De termijn voor de ontvangst van de offertes was 2017-11-02.
De aanbesteding werd gepubliceerd op 2017-09-21.
Leveranciers
De volgende leveranciers worden genoemd in gunningsbesluiten of andere aanbestedingsdocumenten:
Wie?
Wat?
Waar?
Aankoopgeschiedenis
| Datum |
Document |
| 2017-09-21
|
Aankondiging van een opdracht
|
| 2018-02-09
|
Award Aankondiging
|