Recente aanbestedingen waarbij de leverancier ION-TOF GmbH wordt genoemd
2011-12-13Supply of a low energy ion scattering instrument (LEIS system) (FOM Institute for Plasma Physics Rijnhuizen)
The nSI department of FOM is looking to purchase an LEIS system for quantitative analysis of in-situ deposited layers. In this context, the term “in-situ” is used to indicate that the layers are deposited in an integrated instrument such that samples can be transferred between deposition and analysis points quickly (minutes) and without exposure to atmospheric conditions. Examples of processes will be studied with the LEIS system include layer growth, material intermixing, and surface contamination.
The …
Bekijk de aanbesteding » Genoemde leveranciers:ION-TOF GmbH