Semi Automatic Probe Station

Nederlandse organisatie voor Toegepast-Natuurwetenschappelijk Onderzoek TNO

The Radar Technology group within TNO, designs and analyses complex MMICs. In order to achieve our goals, the Radar Technology group has a measurement facility for characterizing individual test structures and analysing the designed MMICs on-wafer. The measurements are performed on 3 independent, semi-automatic probe-stations. These probe stations have 200 mm, temperature controlled, chucks and are used 25 % of the time for automated stepped measurements and 75 % of the time for single chip analysis. These chips may be bare dies placed on the chuck or mounted on a carrier or package.
The goal for 2017 is to replace an older probe station with a new one with a larger (300 mm) chuck in order to handle the wafer sizes in the future. Also, possibilities have to be included for mounting high frequency mixers and/or impedance tuners on the probe arms in order to minimize cable movement and lower the losses in the measurement system.

Deadline

De termijn voor de ontvangst van de offertes was 2017-04-10. De aanbesteding werd gepubliceerd op 2017-02-28.

Wie? Wat? Waar?
Aankoopgeschiedenis
Datum Document
2017-02-28 Aankondiging van een opdracht
2017-05-10 Award Aankondiging
Aankondiging van een opdracht (2017-02-28)
Object
Toepassingsgebied van de aanbesteding
Titel: Micro-elektronische machines en toestellen
Referentienummer: 2017 FPL/INK 50
Korte beschrijving:
The Radar Technology group within TNO, designs and analyses complex MMICs. In order to achieve our goals, the Radar Technology group has a measurement facility for characterizing individual test structures and analysing the designed MMICs on-wafer. The measurements are performed on 3 independent, semi-automatic probe-stations. These probe stations have 200 mm, temperature controlled, chucks and are used 25 % of the time for automated stepped measurements and 75 % of the time for single chip analysis. These chips may be bare dies placed on the chuck or mounted on a carrier or package. The goal for 2017 is to replace an older probe station with a new one with a larger (300 mm) chuck in order to handle the wafer sizes in the future. Also, possibilities have to be included for mounting high frequency mixers and/or impedance tuners on the probe arms in order to minimize cable movement and lower the losses in the measurement system.
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Aankondigingsmetadata
Originele taal: Engels 🗣️
Documenttype: Aankondiging van een opdracht
Aard van de opdracht: Leveringen
Regelgeving: Europese Unie
Gemeenschappelijke woordenlijst overheidsopdrachten (CPV)
Code: Micro-elektronische machines en toestellen 📦
Plaats van uitvoering
NUTS-regio: Nederland 🏙️

Procedure
Type procedure: Openbare procedure
Type bod: Inschrijving voor alle percelen
Gunningscriteria
Uit economisch oogpunt voordeligste inschrijving

Aanbestedende dienst
Identiteit
Land: Nederland 🇳🇱
Type aanbestedende dienst: Publiekrechtelijke instelling
Naam aanbestedende dienst: Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
Postadres: Anna van Buerenplein 1
Postcode: 2595 DA
Poststad: Den Haag
Contact
Internetadres: http://www.tno.nl 🌏
E-mail: jacko.rijnders@tno.nl 📧
Telefoon: +31 888661367 📞
URL van de documenten: https://www.tenderned.nl/tenderned-web/aankondiging/detail/publicatie/akid/9cdedae5613bb5287245a55d1d8ab6ec 🌏
URL voor deelname: https://www.tenderned.nl/tenderned-web/aankondiging/detail/publicatie/akid/9cdedae5613bb5287245a55d1d8ab6ec 🌏

Referentie
Datums
Verzenddatum: 2017-02-28 📅
Indieningstermijn: 2017-04-10 📅
Publicatiedatum: 2017-03-02 📅
Startdatum: 2017-06-01 📅
Einddatum: 2017-12-31 📅
Identificatoren
Aankondigingsnummer: 2017/S 043-078201
PB-S nummer: 43

Object
Toepassingsgebied van de aanbesteding
Korte beschrijving:
The Radar Technology group within TNO, designs and analyses complex MMICs. In order to achieve our goals, the Radar Technology group has a measurement facility for characterizing individual test structures and analysing the designed MMICs on-wafer. The measurements are performed on 3 independent, semi-automatic probe-stations. These probe stations have 200 mm, temperature controlled, chucks and are used 25 % of the time for automated stepped measurements and 75 % of the time for single chip analysis. These chips may be bare dies placed on the chuck or mounted on a carrier or package.
Toon meer
The goal for 2017 is to replace an older probe station with a new one with a larger (300 mm) chuck in order to handle the wafer sizes in the future. Also, possibilities have to be included for mounting high frequency mixers and/or impedance tuners on the probe arms in order to minimize cable movement and lower the losses in the measurement system.
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By means of the present Public Procurement Procedure, TNO has the intention to award a contract based on these Public Procurement Guidelines for the delivery of a Semi-Automatic Probe Station. The contract mainly involves:
— semi–automatic probes station,
— controller for the probe station (with display if appropriate),
— temperature controlled chuck,
— controller for the temperature settings (with display if appropriate),
— microscope,
— controller for the microscope (with display if appropriate),
— 4x probe arms (manual),
— Power line connections,
— Dried air / compressed air hoses if appropriate.
Plaats van uitvoering
Hoofdlocatie of plaats van uitvoering: The Hague, The Netherlands.

Juridische, economische, financiële en technische informatie
Voorwaarden voor deelname
Geschiktheid om de beroepsactiviteit uit te oefenen: No criminal activities in the past.

Procedure
Tijdstip van ontvangst van inschrijvingen: 13:00
Talen waarin inschrijvingen of aanvragen tot deelneming kunnen worden ingediend: Engels 🗣️
Nederlands 🗣️
Geldigheidsduur van de inschrijving: 2017-07-09 📅
Datum opening inschrijvingen: 2017-04-10 📅
Tijdstip van opening inschrijvingen: 13:00
Gunningscriteria
Kwaliteitscriterium (naam): Quality: see EU Public Procurement Guidelines, section 5
Kwaliteitscriterium (weging): 40
Weging van de prijs: 60

Aanbestedende dienst
Identiteit
Nationaal registratienummer: 252056395
Contact
Contactpunt: Jacko Rijnders
Documenten URL: https://www.tenderned.nl/tenderned-web/aankondiging/detail/publicatie/akid/9cdedae5613bb5287245a55d1d8ab6ec 🌏

Aanvullende informatie
Beoordelingsorgaan
Naam: Rechtbank Den Haag
Postadres: Prins Clauslaan 60
Poststad: The Hague
Postcode: 2595 AJ
Land: Nederland 🇳🇱
Telefoon: +31 883622200 📞
E-mail: aanbesteden@tno.nl 📧
Internetadres: http://www.rechtspraak.nl 🌏
Bron: OJS 2017/S 043-078201 (2017-02-28)
Award Aankondiging (2017-05-10)
Object
Toepassingsgebied van de aanbesteding
Korte beschrijving:
The Radar Technology group within TNO, designs and analyses complex MMICs. In order to achieve our goals, the Radar Technology group has a measurement facility for characterizing individual test structures and analyzing the designed MMICs on-wafer. The measurements are performed on three independent, semi-automatic probe-stations. These probe stations have 200 mm, temperature controlled, chucks and are used 25 % of the time for automated stepped measurements and 75 % of the time for single chip analysis. These chips may be bare dies placed on the chuck or mounted on a carrier or package. The goal for 2017 is to replace an older probe station with a new one with a larger (300 mm) chuck in order to handle the wafer sizes in the future. Also, possibilities have to be included for mounting high frequency mixers and/or impedance tuners on the probe arms in order to minimize cable movement and lower the losses in the measurement system.
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Aankondigingsmetadata
Documenttype: Award Aankondiging

Procedure
Type bod: Niet van toepassing

Aanbestedende dienst
Identiteit
Poststad: The Hague

Referentie
Datums
Verzenddatum: 2017-05-10 📅
Publicatiedatum: 2017-05-12 📅
Identificatoren
Aankondigingsnummer: 2017/S 091-179847
Verwijst naar aankondiging: 2017/S 043-078201
PB-S nummer: 91
Aanvullende informatie
There are no tenders received.

Object
Toepassingsgebied van de aanbesteding
Korte beschrijving:
The Radar Technology group within TNO, designs and analyses complex MMICs. In order to achieve our goals, the Radar Technology group has a measurement facility for characterizing individual test structures and analyzing the designed MMICs on-wafer. The measurements are performed on three independent, semi-automatic probe-stations. These probe stations have 200 mm, temperature controlled, chucks and are used 25 % of the time for automated stepped measurements and 75 % of the time for single chip analysis. These chips may be bare dies placed on the chuck or mounted on a carrier or package.
Toon meer

Aanvullende informatie
Beoordelingsorgaan
Poststad: Den Haag
Bron: OJS 2017/S 091-179847 (2017-05-10)
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