2018-01-10Dual Beam PFIB/SEM System (Technische Universiteit Delft)
The objective of the public procurement procedure is to award the contract to one (1) supplier for the delivery of a Plasma Focussed Ion Beam/Scanning Electron Microscope (PFIB/SEM) system to the department of Materials Science and Engineering (MSE) of the faculty 3mE of Delft University of Technology (TU Delft).
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