Aanbestedingen: Oculairs, condensors, collectors, buizen, standaards en afdekhoezen voor microscoop

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Recente aankopen van oculairs, condensors, collectors, buizen, standaards en afdekhoezen voor microscoop in Nederland

2018-05-31   Supply of an In-situ Micromechanical Testing System for Scanning Electron Microscope (European Commission, JRC โ€” Joint Research Centre, JRC.G โ€” Nuclear Safety and Security (Karlsruhe), JRCGI4 โ€” Nuclear Reactor Safe)
The JRC Petten plans to purchase an in-situ micromechanical deformation stage to perform micromechanical testing inside the Scanning electron microscope (SEM) model Zeiss Leo Supra 50. The system must allow performing nanoindentation, tensile, bending and compression tests in-situ. It must also allow the mechanical punching of metallic micro-membranes of several micrometers thickness, while simultaneously imaging the deformation process with the Scanning electron microscope (SEM). Bekijk de aanbesteding ยป